A procedure for the improvement in the determination of a TXRF spectrometer sensitivity curve

Analytical Sciences

Volumn 26, Issue 3, 2010, Pages 331-335

  Bennun, Leonardo ^a   Sanhueza, Vilma ^a  

^a UNIVERSITY OF CONCEPCIÓN   (Chile)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION STANDARD; CERTIFIED VALUES; PURE SUBSTANCES; SENSITIVITY CURVES; TOTAL REFLECTION X-RAY FLUORESCENCE; VALIDATION STUDY;

SPECTROMETERS;

EID: 77953578217     PISSN: 09106340     EISSN: 13482246     Source Type: Journal    
DOI: 10.2116/analsci.26.331     Document Type: Article

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