Monolayer suppression of transport imaged in annealed PbSe nanocrystal arrays

Nano Letters

Volumn 10, Issue 6, 2010, Pages 2155-2161

  Fischbein, Michael D ^a   Puster, Matthew ^a,b   Drndic, Marija ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

Annealing; Charge transport; Electrostatic force microscopy; Nanocrystals; PbSe

Indexed keywords

AFM; BI-LAYER; CHARGE TRANSPORT; CURRENT PATHS; DROP-CAST; ELECTROSTATIC FORCE MICROSCOPY; FUTURE DESIGNS; HIGH-RESOLUTION TEM; LINEAR SCALING; NARROW JUNCTIONS; PBSE NANOCRYSTALS; STRUCTURAL IMAGING; TEM; TRANSMISSION ELECTRON; VACUUM-ANNEALING; VARYING THICKNESS;

ANNEALING; ATOMIC FORCE MICROSCOPY; ELECTRIC FURNACES; ELECTRON ENERGY LEVELS; ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE; MONOLAYERS; MULTILAYERS; NANOCRYSTALS; OPTOELECTRONIC DEVICES; SEMICONDUCTING LEAD COMPOUNDS;

ELECTRIC FORCE MICROSCOPY;

EID: 77953302758     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl100854e     Document Type: Article

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