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Volumn 9, Issue 11, 2009, Pages 3848-3852

High carrier densities achieved at low voltages in ambipolar PbSe nanocrystal thin-film transistors

Author keywords

[No Author keywords available]

Indexed keywords

AMBIPOLAR; CARRIER DENSITY; COLLOIDAL SEMICONDUCTOR NANOCRYSTALS; ELECTRICALLY PUMPED; ELECTRONS AND HOLES; GATE DIELECTRIC LAYERS; HIGH CARRIER MOBILITY; HOLE ACCUMULATION; HOLE DENSITIES; LIGHT-EMITTING TRANSISTORS; LOW VOLTAGES; LOW-VOLTAGE; NANOCRYSTAL LASERS; OPERATION VOLTAGE; PBSE NANOCRYSTALS; TUNABLE EMISSIONS;

EID: 72849118300     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl902062x     Document Type: Article
Times cited : (114)

References (35)
  • 32
    • 72849144147 scopus 로고    scopus 로고
    • It is interesting to note that the capacitance values for both electrons and holes obtained from the intrinsic Si are slightly lower than those measured using PbSe NC films. This can be explained by ion penetration into the bulk of the PbSe NC film. In that case, charge accumulation can occur through the entire NC film, leading to higher capacitance values
    • It is interesting to note that the capacitance values for both electrons and holes obtained from the intrinsic Si are slightly lower than those measured using PbSe NC films. This can be explained by ion penetration into the bulk of the PbSe NC film. In that case, charge accumulation can occur through the entire NC film, leading to higher capacitance values.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.