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Volumn 53, Issue 3, 2010, Pages 454-457
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Valence band structure of strained Si/(111)Si1-xGex
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Author keywords
Hole effective mass; KP method; Strained Si; Valence band
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Indexed keywords
[110] DIRECTION;
CONDUCTION CHANNEL;
GE FRACTION;
HIGH PERFORMANCE DEVICES;
HIGH-SPEED;
HOLE EFFECTIVE MASS;
K-P METHOD;
SI-BASED;
STRAINED-SI;
VALENCE BAND EDGES;
GERMANIUM;
VALENCE BANDS;
SILICON;
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EID: 77953143070
PISSN: 16747348
EISSN: None
Source Type: Journal
DOI: 10.1007/s11433-010-0093-2 Document Type: Article |
Times cited : (25)
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References (9)
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