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Volumn 268, Issue 11-12, 2010, Pages 1938-1941
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A new cluster-ion-beam source for secondary ion mass spectrometry (SIMS) using the electrospray of a pure ionic liquid under high vacuum
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Author keywords
Charged droplet; Cluster ion; Electrospray; Ion beam; Ionic liquid; SIMS
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Indexed keywords
BIS(TRIFLUOROMETHANE SULFONYL)IMIDE;
CHARGED DROPLET;
CLUSTER BEAM SOURCES;
CLUSTER ION;
CLUSTER IONS;
CONSTANT FLOW RATES;
ELECTROSPRAY;
ELECTROSPRAYS;
GAS COMPONENT;
GAS PRESSURES;
HIGH CONDUCTIVITY;
HIGH VACUUM;
ION-BEAM SOURCES;
POSITIVE MODE;
RESIDUAL GAS ANALYSIS;
ROOM-TEMPERATURE MOLTEN SALTS;
AMMONIUM COMPOUNDS;
ATMOSPHERIC PRESSURE;
DROP FORMATION;
FUSED SALTS;
ION BEAMS;
IONIZATION OF LIQUIDS;
IONS;
SECONDARY ION MASS SPECTROMETRY;
STAINLESS STEEL;
VACUUM;
IONIC LIQUIDS;
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EID: 77953140338
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2010.02.097 Document Type: Article |
Times cited : (13)
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References (34)
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