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Volumn 268, Issue 11-12, 2010, Pages 1938-1941

A new cluster-ion-beam source for secondary ion mass spectrometry (SIMS) using the electrospray of a pure ionic liquid under high vacuum

Author keywords

Charged droplet; Cluster ion; Electrospray; Ion beam; Ionic liquid; SIMS

Indexed keywords

BIS(TRIFLUOROMETHANE SULFONYL)IMIDE; CHARGED DROPLET; CLUSTER BEAM SOURCES; CLUSTER ION; CLUSTER IONS; CONSTANT FLOW RATES; ELECTROSPRAY; ELECTROSPRAYS; GAS COMPONENT; GAS PRESSURES; HIGH CONDUCTIVITY; HIGH VACUUM; ION-BEAM SOURCES; POSITIVE MODE; RESIDUAL GAS ANALYSIS; ROOM-TEMPERATURE MOLTEN SALTS;

EID: 77953140338     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.02.097     Document Type: Article
Times cited : (13)

References (34)
  • 32
    • 77953134385 scopus 로고    scopus 로고
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.