-
1
-
-
77953127280
-
CdTe detector use in PIXE characterization of Sn dopped CdO thin films
-
M. Budnar, M. Kavcic (Eds, 8 Junho, Portoroz, Slovenia CD-Edition
-
P.C. Chaves, O.R. Oliveira, V. Corregidor, N. Barradas, O. Vigil Galán, A. Arias Carbajal, M.A. Reis, CdTe detector use in PIXE characterization of Sn dopped CdO thin films, in: M. Budnar, M. Kavcic (Eds.), Proceedings of the 10th International Conference on Particle Induced X-ray Emission and Its Analytical Application, 4 a 8 Junho, 2004, Portoroz - Slovenia (CD-Edition).
-
(2004)
Proceedings of the 10th International Conference on Particle Induced X-ray Emission and Its Analytical Application, 4 a
-
-
Chaves, P.C.1
Oliveira, O.R.2
Corregidor, V.3
Barradas, N.4
Vigil Galán, O.5
Arias Carbajal, A.6
Reis, M.A.7
-
2
-
-
77953135779
-
Grazing detection geometry for PIXE characterization of thin films
-
M. Budnar, M. Kavcic (Eds, 8 Junho, Portoroz, Slovenia CD-Edition
-
M.A. Reis, P.C. Chaves, V. Corregidor, N. Barradas, E. Alves F. Dimroth, A. Bett, Grazing detection geometry for PIXE characterization of thin films, in: M. Budnar, M. Kavcic (Eds.), Proceedings of the 10th International Conference on Particle Induced X-ray Emission and Its Analytical Application, 4 a 8 Junho, 2004, Portoroz - Slovenia (CD-Edition).
-
(2004)
Proceedings of the 10th International Conference on Particle Induced X-ray Emission and Its Analytical Application, 4 a
-
-
Reis, M.A.1
Chaves, P.C.2
Corregidor, V.3
Barradas, N.4
Alves, E.5
Dimroth, F.6
Bett, A.7
-
3
-
-
34447304364
-
-
M.A. Reis, N.P. Barradas, C. Pascual-Izarra, P.C. Chaves, A.R. Ramos, E. Alves, G. González-Aguilar, M.E.V. Costa, Holistic RBS-PIXE data reanalysis of SBT thin film samples, in: Proceedings of the 19th International Conference on the Application of Accelerators in Research and Industry, August 20-25, Fort Worth, Texas, USA, 2006, Nucl. Inst. Meth. Phys. Rev. B 261 (2007) 439-442.
-
M.A. Reis, N.P. Barradas, C. Pascual-Izarra, P.C. Chaves, A.R. Ramos, E. Alves, G. González-Aguilar, M.E.V. Costa, Holistic RBS-PIXE data reanalysis of SBT thin film samples, in: Proceedings of the 19th International Conference on the Application of Accelerators in Research and Industry, August 20-25, Fort Worth, Texas, USA, 2006, Nucl. Inst. Meth. Phys. Rev. B 261 (2007) 439-442.
-
-
-
-
4
-
-
22544444638
-
Detection angle resolved PIXE and the equivalent depth concept for thin films characterization
-
Reis M.A., Chaves P.C., Corregidor V., Barradas N., Alves E., Dimroth F., and Bett A. Detection angle resolved PIXE and the equivalent depth concept for thin films characterization. X-Ray Spectrom. 34 (2005) 372-375
-
(2005)
X-Ray Spectrom.
, vol.34
, pp. 372-375
-
-
Reis, M.A.1
Chaves, P.C.2
Corregidor, V.3
Barradas, N.4
Alves, E.5
Dimroth, F.6
Bett, A.7
-
5
-
-
28044466191
-
Ion beam analysis of GaInAsSb films grown by MOVPE on GaSb
-
Inst. Meth. Phys. Rev B
-
V. Corregidor, N.P. Barradas, E. Alves, N. Franco, L.C. Alves, P.C. Chaves, M.A. Reis, Ion beam analysis of GaInAsSb films grown by MOVPE on GaSb, in: Proceedings of the 18th International Conference on the Application of Accelerators in Research and Industry, Nucl. Inst. Meth. Phys. Rev B (2005) 326-330.
-
(2005)
Proceedings of the 18th International Conference on the Application of Accelerators in Research and Industry, Nucl
, pp. 326-330
-
-
Corregidor, V.1
Barradas, N.P.2
Alves, E.3
Franco, N.4
Alves, L.C.5
Chaves, P.C.6
Reis, M.A.7
-
6
-
-
37849022354
-
Combination of IBA techniques for composition analysis of GaInAsSb films
-
Corregidor V., Chaves P.C., Reis M.A., Pascual-Izarra C., Alves E., and Barradas N.P. Combination of IBA techniques for composition analysis of GaInAsSb films. Mater. Sci. Forum 514-516 (2006) 1603-1607
-
(2006)
Mater. Sci. Forum
, vol.514-516
, pp. 1603-1607
-
-
Corregidor, V.1
Chaves, P.C.2
Reis, M.A.3
Pascual-Izarra, C.4
Alves, E.5
Barradas, N.P.6
-
7
-
-
77953138376
-
New High Resolution and High Energy Lisbon pixe set-up
-
J. Miranda, J.L. Rucalva-Sil, O.G. de Lucio Eds, 25-29 May, Puebla, Mexico, Digitally Published
-
P.C. Chaves, M.A. Reis, E. Alves, New High Resolution and High Energy Lisbon pixe set-up, in: J. Miranda, J.L. Rucalva-Sil, O.G. de Lucio (Eds.), Proceedings of the XI International Conference on PIXE and Its Analytical Applications, 25-29 May, Puebla, Mexico, Digitally Published, 2007.
-
(2007)
Proceedings of the XI International Conference on PIXE and Its Analytical Applications
-
-
Chaves, P.C.1
Reis, M.A.2
Alves, E.3
-
8
-
-
0002679588
-
Simulated annealing analysis of Rutherford backscattering data
-
Barradas N.P., Jeynes C., and Webb R.P. Simulated annealing analysis of Rutherford backscattering data. Appl. Phys. Lett. 71 (1997) 291
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 291
-
-
Barradas, N.P.1
Jeynes, C.2
Webb, R.P.3
-
9
-
-
33744798228
-
Energy calibration of superconducting transition edge sensors for X-ray detection using pulse analysis
-
Hollerith C., Simmnacher B., Weiland R., Feilitzsch F.V., Isaila C., Jochum J., Potzel W., Hohne J., Phelan K., Wernicke D., and May T. Energy calibration of superconducting transition edge sensors for X-ray detection using pulse analysis. Rev. Sci. Instrum. 77 (2006) 053105
-
(2006)
Rev. Sci. Instrum.
, vol.77
, pp. 053105
-
-
Hollerith, C.1
Simmnacher, B.2
Weiland, R.3
Feilitzsch, F.V.4
Isaila, C.5
Jochum, J.6
Potzel, W.7
Hohne, J.8
Phelan, K.9
Wernicke, D.10
May, T.11
-
11
-
-
0010904966
-
-
McCammon D., Cui W., Juda M., Plucinsky P., Zhang J., Kelley R.L., Holt S.S., Madejski G.M., Moseley S.H., and Szymkowiak A.E. Nucl. Phys. A527 (1991) 821c-824c
-
(1991)
Nucl. Phys.
, vol.A527
-
-
McCammon, D.1
Cui, W.2
Juda, M.3
Plucinsky, P.4
Zhang, J.5
Kelley, R.L.6
Holt, S.S.7
Madejski, G.M.8
Moseley, S.H.9
Szymkowiak, A.E.10
-
12
-
-
0031474227
-
High-resolution energy-dispersive microcalorimeter spectrometer for X-ray microanalysis
-
Wollman D.A., Irwin K.D., Hilton G.C., Dulcie L.L., Newbury D.E., and Martinis J.M. High-resolution energy-dispersive microcalorimeter spectrometer for X-ray microanalysis. J. Microsc. 188 Pt. 3 (1997) 196-223
-
(1997)
J. Microsc.
, vol.188
, Issue.PART 3
, pp. 196-223
-
-
Wollman, D.A.1
Irwin, K.D.2
Hilton, G.C.3
Dulcie, L.L.4
Newbury, D.E.5
Martinis, J.M.6
-
13
-
-
0036874806
-
The microcalorimeter for industrial applications
-
Redfern D., Nicolosi J., Hohne J., Weiland R., Simmnacher B., and Hollerich C. The microcalorimeter for industrial applications. J. Res. Natl. Inst. Stand. Technol. 107 (2002) 621-626
-
(2002)
J. Res. Natl. Inst. Stand. Technol.
, vol.107
, pp. 621-626
-
-
Redfern, D.1
Nicolosi, J.2
Hohne, J.3
Weiland, R.4
Simmnacher, B.5
Hollerich, C.6
-
14
-
-
0033732930
-
Superconducting transition-edge-microcalorimeter X-ray spectrometer with 2 eV energy resolution at 1.5 keV
-
Wollman D.A., Nam S.W., Newbury D.E., Hilton G.C., Irwin K.D., Bergren N.F., Deiker S., Rudman D.A., and Martinis J.M. Superconducting transition-edge-microcalorimeter X-ray spectrometer with 2 eV energy resolution at 1.5 keV. Nucl. Inst. Meth. Phys. Res. A 444 (2000) 145-150
-
(2000)
Nucl. Inst. Meth. Phys. Res. A
, vol.444
, pp. 145-150
-
-
Wollman, D.A.1
Nam, S.W.2
Newbury, D.E.3
Hilton, G.C.4
Irwin, K.D.5
Bergren, N.F.6
Deiker, S.7
Rudman, D.A.8
Martinis, J.M.9
-
16
-
-
0002566461
-
An analytical cross-section formula for K X-ray production by protons
-
Paul H. An analytical cross-section formula for K X-ray production by protons. Nucl. Inst. Meth. Phys. Res. B 3 (1984) 5-10
-
(1984)
Nucl. Inst. Meth. Phys. Res. B
, vol.3
, pp. 5-10
-
-
Paul, H.1
-
17
-
-
0030143870
-
Semiempirical approximation to cross sections for L X-ray production by proton impact
-
Reis M.A., and Jesus A.P. Semiempirical approximation to cross sections for L X-ray production by proton impact. Atom. Data Nucl. Data Tables 63 (1996) 1-55
-
(1996)
Atom. Data Nucl. Data Tables
, vol.63
, pp. 1-55
-
-
Reis, M.A.1
Jesus, A.P.2
-
18
-
-
41049095387
-
DATTPIXE, a computer package for TTPIXE data analysis
-
Reis M.A., and Alves L.C. DATTPIXE, a computer package for TTPIXE data analysis. Nucl. Inst. Meth. Phys. Res. B 68 1-4 (1992) 300-304
-
(1992)
Nucl. Inst. Meth. Phys. Res. B
, vol.68
, Issue.1-4
, pp. 300-304
-
-
Reis, M.A.1
Alves, L.C.2
-
19
-
-
84917960687
-
Natural widths of atomic K and L levels, K X-ray lines and several KLL Auger lines
-
Krause M.O., and Oliver J.H. Natural widths of atomic K and L levels, K X-ray lines and several KLL Auger lines. J. Phys. Chem. Ref. Data 8 (1979) 329
-
(1979)
J. Phys. Chem. Ref. Data
, vol.8
, pp. 329
-
-
Krause, M.O.1
Oliver, J.H.2
-
21
-
-
0347534102
-
Fluorescence yields and Coster-Kronig probabilities for the atomic L subshells
-
Campbell J.L. Fluorescence yields and Coster-Kronig probabilities for the atomic L subshells. Atom. Data Nucl. Data Tables 85 (2003) 291-315
-
(2003)
Atom. Data Nucl. Data Tables
, vol.85
, pp. 291-315
-
-
Campbell, J.L.1
|