Novel physical unclonable function with process and environmental variations

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2010, Pages 1065-1070

  Wang, Xiaoxiao ^a   Tehranipoor, Mohammad ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ENVIRONMENTAL VARIATIONS; INPUT PATTERNS; PHYSICAL UNCLONABLE FUNCTIONS; POWER-SUPPLY NOISE; PROCESS PARAMETERS; PROCESS VARIATION; SIDE CHANNEL ATTACK; SIDE-CHANNEL INFORMATION; SIMULATION RESULT; SOURCES OF VARIATION; SPATIAL CORRELATIONS;

ACCESS CONTROL; INTEGRATED CIRCUITS;

DESIGN;

EID: 77953101387     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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