Analog circuit fault diagnosis under parameter variations based on type-2 fuzzy logic systems

International Journal of Innovative Computing, Information and Control

Volumn 6, Issue 5, 2010, Pages 2137-2158

  Lin, Tsung Chih ^a  

^a FENG CHIA UNIVERSITY   (Taiwan)

Author keywords

Hard fault; Simulation after test; Simulation before test; Soft fault; Type 1 fuzzy logic system; Type 2 fuzzy logic system

Indexed keywords

CIRCUIT UNDER TEST; FAULT SIMULATION; FAULTY ELEMENTS; FUZZY LOGIC SYSTEM; FUZZY RULE BASE; MEASUREMENT DATA; MEASUREMENT UNCERTAINTY; NOISY MEASUREMENT DATA; PARAMETER VARIATION; SOFT FAULT DIAGNOSIS; SOFT FAULTS; TYPE-2 FUZZY LOGIC SYSTEM; WHITE GAUSSIAN NOISE;

ANALOG CIRCUITS; FAILURE ANALYSIS; FUZZY RULES; FUZZY SYSTEMS; LOGIC CIRCUITS; TESTING; UNCERTAINTY ANALYSIS;

FUZZY LOGIC;

EID: 77952960520     PISSN: 13494198     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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