Fault diagnosis of analog circuits with model-based technique

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 1998, Pages 501-504

  Catelani, M ^a   Giraldi, S ^a  

^a UNIVERSITY OF FLORENCE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; ELECTRIC NETWORK ANALYSIS; ERROR ANALYSIS; ERROR DETECTION; MATHEMATICAL MODELS;

ANALOG CIRCUITS; AUTOMATIC MEASUREMENT SYSTEMS; SYMBOLIC ANALYSIS;

ANALOG COMPUTERS;

EID: 0031653926     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)