Coefficient-based test of parametric faults in analog circuits

IEEE Transactions on Instrumentation and Measurement

Volumn 55, Issue 1, 2006, Pages 150-157

  Guo, Zhen ^a   Savir, Jacob ^a  

^a NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Fault detection; Monte Carlo simulation; Parameter tolerance; Parametric faults; System identification

Indexed keywords

COMPUTER SIMULATION; IDENTIFICATION (CONTROL SYSTEMS); LINEAR SYSTEMS; LOW PASS FILTERS; MONTE CARLO METHODS; REGRESSION ANALYSIS; TRANSFER FUNCTIONS;

ANALOG CIRCUITS; FAULT DETECTION; PARAMETER TOLERANCE; PARAMETRIC FAULTS;

NETWORKS (CIRCUITS);

EID: 32044461556     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2005.861490     Document Type: Article

References (17)

1. P. N. Variyam, S. Cherubal, and A. Chatterjee, "Prediction of analog performance parameters using fast transient testing," IEEE Trans. Comput.-Aided Des. Integr. Circuit Syst., vol. 21, no. 3, pp. 349-361, Mar. 2002.
2. G. Devarayanadurg, P. Goeteti, and M. Soma, "Hierarchy based on fault simulation of mixed-signal IC's," in Proc. Int. Test Conf., Washington, DC, 1996, pp. 521-527.
3. J. Roh, S. Seshadri, and J. A. Abraham, "Verification of delta-sigma converters using adaptive regression modelling," in Proc. Int. Conf. Computer Aided Design (ICCAD), San Jose, CA, 2000, pp. 182-187.
4. A. Abderrahman et al., "Worst case tolerance analysis and CLP-based multifrequency test generation for analog circuit," IEEE Trans. Comput.-Aided Des. Integr. Circuit Syst., vol. 18, no. 3, pp. 332-345, Mar. 1999.
5. R. Ramadoss and M. L. Bushnell, "Test generation for mixed signal devices using signal flow graph," J. Electron. Test.: Theory Appl., vol. 14, no. 3, pp. 189-205, 1999.
6. G. J. Hemink et al., "Testability analysis of analog systems," IEEE Trans. Comput.-Aided Des. Integr. Circuit Syst., vol. 9, no. 6, pp. 573-583, Jun. 1990.
7. J. Savir and Z. Guo, "On the detectability of parametric faults in analog circuits," in Proc. Int. Conf. Computer Design (ICCD), Freiburg, Germany, Sep. 2002, pp. 273-276.
8. J. Savir and Z. Guo, "Test limitations of parametric faults in analog circuits," in Proc. Asian Test Symp. (ATS), Tamuning, GU, 2002, pp. 39-44.
9. J. Savir and Z. Guo, "Test limitations of parametric faults in analog circuits," IEEE Trans. Instrum. Meas., vol. 52, no. 5, pp. 1444-1454, Oct. 2003.
10. P. Clayton, Analysis of Linear Circuits. New York: McGraw-Hill, 1989.
11. T. E. Fortmann, An Introduction to Linear Control Sytem. New York: Marcel Dekker, 1977.
12. D. A. Johns and K. Martin, Analog Integrated Circuit Design. New York: Wiley, 1997.
13. MATLAB Version 6: System Identification Toolbox, Natick, MA, The MathWorks.
14. MATLAB Version 6: Control Toolbox, Natick, MA, The MathWorks.
15. L. Ljung, System Identification: Theory for the User. Englewood Cliffs, NJ: Prentice-Hall, 1987.
16. C.-T. Chen, Analog and Digital Control System Design: Transfer Function, State-Space, and Algebraic Methods. Philadelphia, PA: Saunders, 1993.
17. R. D. Strum and D. E. Kirk, Contemporary Linear System Using MATLAB. Pacific Grove, CA: Brooks/Cole. ISBN 0-534-37172-8.