Fault diagnosis of large scale analog circuits based on symbolic method

Chinese Journal of Electronics

Volumn 7, Issue 4, 1998, Pages 395-399

  Wei, Tao ^a,b,c   Wong, Mike W T ^{a,d,e,f,g,h,i}   Lee, Y S ^{a,e,g,j,k,l,m}  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^b Beijing Broadcasting Institute   (China)

^c Packaging Technology   (Singapore)

^d NEWCASTLE UNIVERSITY   (United Kingdom)

^e UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

^f International Computers Ltd   (United Kingdom)

^g IEE   (United Kingdom)

^h IEEE   (Hong Kong)

ⁱ IEE Hong Kong Centre   (Hong Kong)

^j UNIVERSITY OF HONG KONG   (Hong Kong)

^k DEPARTMENT OF HEALTH   (Hong Kong)

^l University of Hong Kong ^*  (Hong Kong)

^m Marcel Dekker Inc   (United States)

more..

Author keywords

Analog fault diagnosis; Large change sensitivity; Linear analog circuits; Sequence of expressions; Symbolic method

Indexed keywords

ALGORITHMS; FAULT TREE ANALYSIS; LINEAR NETWORKS; OPTIMIZATION; SENSITIVITY ANALYSIS;

ANALOG CIRCUIT FAULT; FAULT DIAGNOSIS; LARGE LINEAR ANALOG CIRCUITS; SYMBOLIC METHOD;

ELECTRIC FAULT CURRENTS;

EID: 0032181803     PISSN: 10224653     EISSN: 20755597     Source Type: Journal    
DOI: None     Document Type: Article

References (10)

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