Water-swelling-induced morphological instability of a supported polymethyl methacrylate thin film

Langmuir

Volumn 26, Issue 11, 2010, Pages 7651-7655

  Jing, Benxin ^a   Zhao, Jiang ^a   Wang, Yan ^b   Yi, Xin ^b   Duan, Huiling ^b  

^a INSTITUTE OF CHEMISTRY   (China)

^b PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; ANNEALING TIME; INTERIOR LAYER; MORPHOLOGICAL INSTABILITY; PMMA FILMS; RADIUS OF CURVATURE; SOLID SUBSTRATES; SURFACE MORPHOLOGY ANALYSIS; TWO LAYER MODEL; UNDER WATER;

ESTERS;

THIN FILMS;

POLY(METHYL METHACRYLATE); WATER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY;

MICROSCOPY, ATOMIC FORCE; POLYMETHYL METHACRYLATE; WATER;

EID: 77952809337     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la1004566     Document Type: Article

References (48)

1. Hutchinson, J. W., Thouless, M. D., and Liniger, E. G. Acta Metall. Mater. 1992, 40, 295-308
2. Reiter, G. Phys. Rev. Lett. 1992, 68, 75-78
3. Stafford, C. M., Vogt, B. D., Harrison, C., Julthongpiput, D., and Huang, R. Macromolecules 2006, 39, 5095-5099
4. Stafford, C. M., Harrison, C., Beers, K. L., Karim, A., Amis, E. J., Vanlandingham, M. R., Kim, H. C., Volksen, W., Miller, R. D., and Simonyi, E. E. Nat. Mater. 2004, 3, 545-550
5. Bodiguel, H. and Fretigny, C. Macromolecules 2007, 40, 7291-7298
6. Gabriele, S., Damman, P., Sclavons, S., Desprez, S., Coppee, S., Reiter, G., Hamieh, M., Al Akhrass, S., Vilmin, T., and Raphael, E. J. Polym. Sci., Part B: Polym. Phys. 2006, 44, 3022-3030
7. Bodiguel, H. and Fretigny, C. Phys. Rev. Lett. 2006, 97, 266105
8. Blossey, R., Munch, A., Rauscher, M., and Wagner, B. Eur. Phys. J. E 2006, 20, 267-271
9. Fetzer, R., Rauscher, M., Seemann, R., Jacobs, K., and Mecke, K. Phys. Rev. Lett. 2007, 99, 114503
10. Fetzer, R., Munch, A., Wagner, B., Rauscher, M., and Jacobs, K. Langmuir 2007, 23, 10559-10566
11. Cotterell, B. and Chen, Z. Fracture Strength Solids, Pts 1 and 2 2000, 183-187, 187-192
12. Figiel, L. and Lauke, B. Int. J. Fract. 2006, 139, 71-89
13. Fedorov, A. and De Hosson, J. T. M. J. Appl. Phys. 2005, 97, 123510
14. Fedorov, A. V., van Tijum, R., Vellinga, W. P., and De Hosson, J. T. M. Prog. Org. Coat. 2007, 58, 180-186
15. Damman, P., Gabriele, S., Coppee, S., Desprez, S., Villers, D., Vilmin, T., Raphael, E., Hamieh, M., Akhrass, S. A., and Reiter, G. Phys. Rev. Lett. 2007, 99, 036101
16. Akhrass, S. A., Reiter, G., Hou, S. Y., Yang, M. H., Chang, Y. L., Chang, F. C., Wang, C. F., and Yang, A. C. M. Phys. Rev. Lett. 2008, 100, 178301
17. Kao, J. C. T., Golovin, A. A., and Davis, S. H. J. Colloid Interface Sci. 2006, 303, 532-545
18. Verma, R. and Sharma, A. Ind. Eng. Chem. Res. 2007, 46, 3108-3118
19. Hamieh, M., Al Akhrass, S., Hamieh, T., Damman, P., Gabriele, S., Vilmin, T., Raphael, E., and Reiter, G. J. Adhes. 2007, 83, 367-381
20. Huang, R., Stafford, C. M., and Vogt, B. D. J. Aerosp. Eng 2007, 20, 38-44
21. Edmondson, S., Frieda, K., Comrie, J. E., Onck, P. R., and Huck, W. T. S. Adv. Mater. 2006, 18, 724-728
22. Cai, Y. and Newby, B. M. Z. Langmuir 2008, 24, 5202-5208
23. Baralia, G. G., Filiatre, C., Nysten, B., and Jonas, A. M. Adv. Mater. 2007, 19, 4453-4459
24. Baffoun, A., Haidara, H., Dupuis, D., and Viallier, P. Langmuir 2007, 23, 9447-9454
25. Lin, Y. H., Jiang, C., Xu, J., Lin, Z. Q., and Tsukruk, V. V. Adv. Mater. 2007, 19, 3827-3832
26. Suh, K. Y., Seo, S. M., Yoo, P. J., and Lee, H. H. J. Chem. Phys. 2006, 124, 024710
27. Chan, E. P. and Crosby, A. J. Soft Matter 2006, 2, 324-328
28. Mukherjee, R., Gonuguntla, M., and Sharma, A. J. Nanosci. Nanotech. 2007, 7, 2069-2075
29. Ferrell, N. and Hansford, D. Macromol. Rapid Commun. 2007, 28, 966-971
30. Stevens, F., Leach, R. N., Langford, S. C., and Dickinson, J. T. Langmuir 2006, 22, 3320-3325
31. Leach, R. N., Stevens, F., Seiler, C., Langford, S. C., and Dickinson, J. T. Langmuir 2003, 19, 10225-10232
32. Bonaccurso, E., Butt, H. J., Franz, V., Graf, K., Kappl, M., Loi, S., Niesenhaus, B., Chemnitz, S., Bohm, M., Petrova, B., Jonas, U., and Spiess, H. W. Langmuir 2002, 18, 8056-8061
33. Castro, L. B. R., Almeida, A. T., and Petri, D. F. S. Langmuir 2004, 20, 7610-7615
34. Xu, L., Shi, T. F., and An, L. Langmuir 2007, 23, 9282-9286
35. Haidara, H., Vonna, L., and Schultz, J. Langmuir 1998, 14, 3425-3434
36. Castner, D. G. and Ratner, B. D. Surf. Sci. 2002, 500, 28-60
37. Ko, H. S., Liu, C. W., and Gau, C. J. Micromech. Microeng. 2007, 17, 1640-1648
38. Ishiyama, C. and Higo, Y. J. Polym. Sci., Part B: Polym. Phys. 2002, 40, 460-465
39. Hamouda, A. M. S. J. Mater. Process. Technol. 2002, 124, 238-243
40. Watanabe, T., Ooba, N., Hida, Y., and Hikita, M. Appl. Phys. Lett. 1998, 72, 1533-1535
41. Matsuguchi, M., Sadaoka, Y., Sakai, Y., Kuroiwa, T., and Ito, A. J. Electrochem. Soc. 1991, 138, 1862-1865
42. Cui, L. L., Jiang, J., Xia, Z. G., Chen, G. J., and Wang, Z. Z. J. Electrost. 1998, 44, 61-65
43. Smith, L. S. A. and Schmitz, V. Polymer 1988, 29, 1871-1878
44. Tanaka, K., Fujii, Y., Atarashi, H., Akabori, K. i., Hino, M., and Nagamura, T. Langmuir 2008, 24, 296-301
45. Sutandar, P., Ahn, D. J., and Franses, E. I. Macromolecules 1994, 27, 7316-7328
46. 3/s, and the time for air to fill a bubble of typical dimension (L = 1 μm, h = 53 nm) is about 5 ms.
47. Choi, S. R., Hutchinson, J. W., and Evans, A. G. Mech. Mater. 1999, 31, 431-447
48. Kwok, D. Y., Wu, R., Li, A., and Neumann, A. W. J. Adhes. Sci. Technol. 2000, 14, 719-743