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Volumn 27, Issue 11, 2002, Pages 888-890
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Phase determination in interference-based superresolving microscopes through critical frequency analysis
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0036601643
PISSN: 01469592
EISSN: None
Source Type: Journal
DOI: 10.1364/OL.27.000888 Document Type: Article |
Times cited : (4)
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References (14)
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