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Volumn 10, Issue , 2008, Pages

4Pi microscopy with negligible sidelobes

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE MICROSCOPY; MICROSCOPIC EXAMINATION; OPTICAL TRANSFER FUNCTION; WAVEFRONTS;

EID: 46449120993     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/10/4/043041     Document Type: Article
Times cited : (26)

References (33)
  • 3
    • 46449121812 scopus 로고    scopus 로고
    • Hell S W 1990 European Patent 0491289
    • Hell S W 1990 European Patent 0491289
  • 10
    • 33847728968 scopus 로고    scopus 로고
    • Nanoscale resolution in far-field fluorescence microscopy
    • ed P W Hawkes and J C Spence (New York: Springer) pp
    • Hell S W and Schönle A 2006 Nanoscale resolution in far-field fluorescence microscopy Science of Microscopy ed P W Hawkes and J C Spence (New York: Springer) pp 790-834
    • (2006) Science of Microscopy , pp. 790-834
    • Hell, S.W.1    Schönle, A.2
  • 25
    • 34249945258 scopus 로고    scopus 로고
    • Hell S W 2007 Science 316 1153-8
    • (2007) Science , vol.316 , pp. 1153-1158
    • Hell, S.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.