Physical insights on graphene nanoribbon mobility through atomistic simulations

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2009, Pages

  Betti, A ^a   Fiori, G ^a   Iannaccone, G ^a   Mao, Y ^b  

^a UNIVERSITY OF PISA   (Italy)

^b DANA FARBER CANCER INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMISTIC SIMULATIONS; GRAPHENE NANO-RIBBON; IONIZED IMPURITIES; LINE EDGE ROUGHNESS; OPTICAL PHONONS; SINGLE DEFECT;

DEFECTS; ELECTRON DEVICES; PHONONS; PHOTORESISTS; ROUGHNESS MEASUREMENT;

CARRIER MOBILITY;

EID: 77952418527     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2009.5424276     Document Type: Conference Paper

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