Modeling of probabilistic ripple-carry adders

Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010

Volumn , Issue , 2010, Pages 201-206

  Lau, Mark S K ^a   Ling, Keck Voon ^a   Chu, Yun Chung ^a   Bhanu, Arun ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Error propagation; Noise modeling; Probabilistic computation; Ripple carry adder

Indexed keywords

CLASS OF DISTRIBUTIONS; ERROR PROBABILITIES; ERROR PROPAGATION; EXPLICIT EXPRESSIONS; GAUSSIANS; HSPICE SIMULATIONS; NOISE MODELING; PREDICT ERRORS; PROBABILISTIC COMPUTATION; REASONABLE ACCURACY; RIPPLE CARRY ADDERS;

COMPUTER SIMULATION; MATHEMATICAL MODELS; PROBABILITY DISTRIBUTIONS;

ADDERS;

EID: 77952390411     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DELTA.2010.14     Document Type: Conference Paper

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