Detection of subsurface defects of fused silica optics by confocal scattering microscopy

Chinese Optics Letters

Volumn 8, Issue 3, 2010, Pages 296-299

  Ma, Bin ^a,b   Shen, Zhengxiang ^a,b   He, Pengfei ^a   Ji, Yiqin ^b   Sang, Tian ^a,c   Liu, Huasong ^a,b   Liu, Dandan ^b   Wang, Zhanshan ^a,b  

^a TONGJI UNIVERSITY   (China)

^b TIANJIN JINHANG INSTITUTE OF TECHNICAL PHYSICS   (China)

^c Qiannan Normal University for Nationalities   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CONFOCAL SCANNING; DIRECT MEASUREMENT METHOD; FUSED SILICA OPTICS; GRINDING AND POLISHING; IN-PROCESS; LIGHT SCATTERING METHOD; MICRON SCALE; NON-DESTRUCTIVE TECHNIQUE; REAL TIME; SCATTERED LIGHT; SUBSURFACE DEFECT;

CRACK DETECTION; DEFECTS; GRINDING (MACHINING); LIGHT; LIGHT SCATTERING; SCATTERING; SILICA; TOMOGRAPHY;

FUSED SILICA;

EID: 77951986304     PISSN: 16717694     EISSN: None     Source Type: Journal    
DOI: 10.3788/COL20100803.0296     Document Type: Article

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