Rigorous theory for axial resolution in confocal microscopes

Optics Communications

Volumn 137, Issue 1-3, 1997, Pages 127-135

  Torok P ^a,b   Wilson, T ^b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Confocal microscopy; Diffraction; Focusing; High aperture; Scanning optical microscopy; Vectorial theory

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; FOCUSING; LIGHT POLARIZATION; MATHEMATICAL MODELS; OPTICAL INSTRUMENT LENSES; PHOTODETECTORS; SCANNING;

AXIAL RESOLUTION; SCANNING OPTICAL MICROSCOPY; VECTORIAL THEORY;

OPTICAL MICROSCOPY;

EID: 0031125107     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(96)00771-7     Document Type: Article

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