Detection of sub-surface damage: Studies in sapphire

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3060, Issue , 1997, Pages 102-114

  Black, David ^a   Polvani, Robert ^a   Braun, Linda ^a   Hockey, Bernard ^a   White, Grady ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Raman spectroscopy; Sapphire; Sub surface damage; Surface damage; Transmission electron microscopy; X ray topography

Indexed keywords

CRACKS; DEFECTS; GRAIN BOUNDARIES; NONDESTRUCTIVE EXAMINATION; RAMAN SPECTROSCOPY; SAPPHIRE; STRAIN; TRANSMISSION ELECTRON MICROSCOPY;

SUBSURFACE DAMAGE;

SINGLE CRYSTALS;

EID: 0031288755     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.277036     Document Type: Conference Paper

References (17)

1. Transitions in the mechanisms of material removal in abrasive wear of alumina
2. Electrically assisted guiding of advanced ceramic materials
3. Rapidly renewable polishing lap
4. Observation by transmission electron microscopy on the subsurface damage produced in aluminum oxide by mechanical polishing and grinding
5. Sur les modfications que la reflexion speculaire a la surface des corps metallques iques inprime a un rayon de lumiere polarisee
6. Methode pratique d'examen et de mesure de la birefringence des verres d' optique
7. Surface studies of solids by total reflection of x-rays
8. Reflection and refraction at oblique incidence on a dielectric-metallic interface as a boundary value problem in electromagnetic theory