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Volumn 285, Issue 18, 2010, Pages 14005-14019

An intersubunit interaction between S4-S5 linker and S6 is responsible for the slow off-gating component in Shaker K+ channels

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED RESIDUES; GATING CURRENTS; INTERSUBUNIT INTERACTION; ION CONDUCTION; ION PERMEATION; MEMBRANE POTENTIALS; MOLECULAR DETERMINANTS; PORE OPENINGS; POSITIVELY CHARGED; SLOW COMPONENT; VOLTAGE GATED ION CHANNELS; VOLTAGE SENSOR;

EID: 77951547997     PISSN: 00219258     EISSN: 1083351X     Source Type: Journal    
DOI: 10.1074/jbc.M109.097717     Document Type: Article
Times cited : (70)

References (48)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.