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Volumn 38, Issue 3, 2010, Pages 1686-1732

Innovated higher criticism for detecting sparse signals in correlated noise

Author keywords

Adding noise; Cholesky factorization; Empirical process; Innovation; Multiple hypothesis testing; Sparse normal means; Spectral density; Toeplitz matrix

Indexed keywords


EID: 77951460458     PISSN: 00905364     EISSN: None     Source Type: Journal    
DOI: 10.1214/09-AOS764     Document Type: Article
Times cited : (187)

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