Goodness-of-fit tests via phi-divergences

Annals of Statistics

Volumn 35, Issue 5, 2007, Pages 2018-2053

  Jager, Leah ^a   Wellner, Jon A ^b  

^a GRINNELL COLLEGE   (United States)

^b UNIVERSITY OF WASHINGTON   (United States)

Author keywords

Alternatives; Combining p values; Confidence bands; Goodness of fit; Hellinger; Large deviations; Multiple comparisons; Normalized empirical process; Phi divergence; Poisson boundaries

Indexed keywords

EID: 50449083797     PISSN: 00905364     EISSN: None     Source Type: Journal    
DOI: 10.1214/0009053607000000244     Document Type: Article

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