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Volumn 31, Issue 2, 2010, Pages 36-40

Thermal cycling reliability of Sn-Cu-Ni (-Ce) joints

Author keywords

Intermetallic compound; Lead free solder; Mechanical property; Thermal cycling

Indexed keywords

CE ADDITION; GROWTH BEHAVIOR; IMC LAYER; INTERMETALLIC COMPOUNDS; LEAD FREE SOLDERS; LEAD-FREE SOLDER; PULL FORCE; QUAD FLAT PACKS; THERMAL CYCLING RELIABILITY;

EID: 77951460385     PISSN: 0253360X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (4)

References (10)
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  • 2
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  • 3
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    • Nogita, K.1    Gourlay, C.M.2    Read, J.3
  • 4
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    • Microstructure and mechanical properties of new lead-free Sn-Cu-RE solder alloys
    • Wu C M L, Yu D Q, Law C M T, et al. Microstructure and mechanical properties of new lead-free Sn-Cu-RE solder alloys [J]. Journal of Electronic Materials, 2002, 31(9): 928-932.
    • (2002) Journal of Electronic Materials , vol.31 , Issue.9 , pp. 928-932
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  • 5
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    • Fracture mechanism analysis of QFP micro-joints soldered with Sn-Pb and SnAgCu solders
    • Xue Songbai, Shi Yiping, Hu Yongfang. Fracture mechanism analysis of QFP micro-joints soldered with Sn-Pb and SnAgCu solders [J]. Transactions of Nonferrous Metals Society of China, 2005, 15(S3): 311-316.
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    • Xue, S.1    Shi, Y.2    Hu, Y.3
  • 6
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    • Microstructure and fracture of Pb-free solder interconnects in ceramic ball grid array packages under thermal cycling
    • Wang Wei, Wang Zhongguang, Xian Aiping, et al. Microstructure and fracture of Pb-free solder interconnects in ceramic ball grid array packages under thermal cycling [J]. Acta Metallurgica Sinica, 2006, 42(6): 647-652.
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  • 7
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.