Tracing X-rays through an L-shaped laterally graded multilayer mirror: A synchrotron application

Journal of Synchrotron Radiation

Volumn 17, Issue 3, 2010, Pages 352-359

  Honnicke, Marcelo Goncalves ^a   Huang, Xianrong ^a   Keister, Jeffrey W ^a   Kodituwakku, Chaminda Nalaka ^a   Cai, Yong Q ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

High resolution; Multilayer simulation; Ray tracing; X ray mirrors; X ray optics

Indexed keywords

ANALYZER SYSTEM; FIGURE ERROR; GRADED MULTILAYER MIRRORS; HIGH RESOLUTION; INELASTIC X RAY SCATTERING; KIRKPATRICK-BAEZ MIRROR; L-SHAPED; LAYER THICKNESS; MIRROR FIGURE; MULTI-LAYER MIRRORS; NATIONAL SYNCHROTRON LIGHT SOURCES; NUMBER OF LAYERS; SLOPE ERRORS; SOURCE PARAMETERS; THEORETICAL MODELS; X RAY MIRRORS;

ELEMENTARY PARTICLE SOURCES; LIGHT; LIGHT SOURCES; MIRRORS; MULTILAYERS; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAY SCATTERING; X RAY SPECTROMETERS;

X RAYS;

EID: 77951442499     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049510004383     Document Type: Article

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