Analysis of cross-correlation of interface roughness in multilayer structures with ultrashort periods

Journal of Experimental and Theoretical Physics

Volumn 103, Issue 3, 2006, Pages 346-353

  Vainer, Yu A ^a   Pestov, A E ^a   Prokhorov, K A ^a   Salashchenko, N N ^a   Fraerman, A A ^a   Chernov, V V ^a   Chkhalo, N I ^a  

^a INSTITUTE FOR PHYSICS OF MICROSTRUCTURES   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION SCATTERING; INTERFACE ROUGHNESS; ROUGHNESS CORRELATION; ULTRASHORT PERIODS;

BOUNDARY LAYERS; CORRELATION METHODS; DIFFUSION; MATHEMATICAL MODELS; SUBSTRATES; SURFACE ROUGHNESS; WAVE PROPAGATION;

MULTILAYERS;

EID: 33750008632     PISSN: 10637761     EISSN: None     Source Type: Journal    
DOI: 10.1134/S1063776106090020     Document Type: Article

References (35)

1. H. Göbel, in Abstracts of ACA Annual Meeting (Pittsburgh, PA, 1992), Vol. 20, p. 3.
2. A. D. Akhsakhalyan, B. A. Volodin, E. B. Klyuenkov, et al., Poverkhnost: Rentgen. Sinkhrotron. Neǐtron. Issled., No. 1, 162 (1999).
3. N. N. Salashchenko and E. Shaniov, Opt. Commun. 134, 7 (1997).
4. F. Shafers, H.-Ch. Mertins, A. Gaupp, et al., Appl. Opt. 38, 4074 (1999).
5. S. S. Andreev, M. S. Bibishkin, H. Kimura, et al., Izv. Ross. Akad. Nauk, Ser. Fiz. 68, 563 (2004).
6. J. I. Martin, J. Nognes, K. Lin, et al., J. Magn. Magn. Mater. 256, 449 (2003).
7. Yu. Platonov, L. Gomez, and D. Broadway, Proc. SPIE 4782, 152 (2002).
8. S. S. Andreev, M. S. Bibishkin, N. I. Chkhalo, et al., J. Synchrotron Radiat. 10, 358 (2003).
9. D. G. Stearns, J. Appl. Phys. 65, 491 (1989).
10. D. E. Savage, J. Kleiner, N. Schimke, et al., J. Appl. Phys. 69, 1411 (1991).
11. V. Holy and T. Baumbach, Phys. Rev. B 49, 10 668 (1994).
12. D. K. G. de Boer, Phys. Rev. B 44, 498 (1991).
13. D. Bahr, W. Press, R. Jebasinski, and S. Mantl, Phys. Rev. B 47, 498 (1991).
14. A. P. Payne and B. M. Clemens, Phys. Rev. B 47, 2289 (1993).
15. A. V. Andreev, Yu. V. Ponomarev, I. R. Prudnikov, and N. N. Salashchenko, Pis'ma Zh. Éksp. Teor. Fiz. 66, 219 (1997)
16. [JETP Lett. 66, 236 (1997)].
17. A. V. Andreev, A. G. Michette, and A. Renwick, J. Mod. Opt. 35, 1667 (1988).
18. O. Renner, M. Kopecky, E. Krousky, et al., Rev. Sci. Instrum. 63, 1478 (1992).
19. A. V. Andreev, Yu. V. Ponomarev, and Yu. Ya. Platonov, Poverkhnost: Rentgen. Sinkhrotron. Neǐtron. Issled., Nos. 3-4, 101 (1996).
20. D. G. Stearns, D. P. Gainess, D. W. Sweeney, et al., J. Appl. Phys. 84, 1003 (1998).
21. N. V. Kovalenko, S. V. Mytnichenko, and V. A. Chernov, Zh. Éksp. Teor. Fiz. 124, 1345 (2003)
22. [JETP 97, 1201 (2003)].
23. A. A. Fraerman, S. V. Gaponov, V. M. Genkin, et al., Nucl. Instrum. Methods Phys. Res. A 261, 91 (1987).
24. V. Holy, J. Kubena, I. Ohlidal, et al., Phys. Rev. B 47, 15 896 (1993).
25. J. H. Underwood and T. W. Barbee, Appl. Opt. 20, 3027 (1981).
26. S. M. Rytov, Yu. A. Kravtsov, and V. I. Tatarskiǐ, Introduction to Statistical Radio Physics (Nauka, Moscow, 1978), Part 2, p. 197 [in Russian].
27. S. V. Gaponov, V. M. Genkin, N. N. Salashchenko, and A. A. Fraerman, Zh. Tekh. Fiz. 56, 708 (1986)
28. [Sov. Phys. Tech. Phys. 31, 427 (1986)].
29. S. S. Andreev, A. D. Akhsakhalyan, M. S. Bibishkin, et al., Central Eur. J. Phys. 1, 191 (2003).
30. A. D. Akhsakhalyan, A. A. Fraerman, Yu. Ya. Platonov, et al., Thin Solid Films 203, 317 (1991).
31. J. B. Shellan, P. Agmon, P. Yeh, et al., J. Opt. Soc. Am.68, 18 (1978).
32. S. S. Andreev, S. V. Gaponov, S. A. Gusev, et al., Thin Solid Films 415, 123 (2002).
33. N. I. Chkhalo, M. V. Fedorchenko, E. P. Kruglyakov, et al., Nucl. Instrum. Methods Phys. Res. A 359, 155 (1995).
34. E. Spiller, Opt. Eng. 29, 609 (1990).
35. S. P. Vernon, D. G. Stearns, and R. S. Rosen, Appl. Opt. 32, 6969 (1993).