State-of-the-art of multilayer optics for laboratory X-ray devices

Particle and Particle Systems Characterization

Volumn 22, Issue 6, 2006, Pages 378-383

  Hertlein, Frank ^a   Oehr, Alexandra ^a   Hoffmann, Christian ^a   Michaelsen, Carsten ^a   Wiesmann, Jörg ^a  

^a INCOATEC GmbH ^*  (Germany)

Author keywords

G bel Mirror; Multilayer optics; Synchrotron sources; X Ray diffraction; X ray fluorescence spectrometry; X ray optics

Indexed keywords

COMPUTER SIMULATION; DEPOSITION; FLUORESCENCE; MIRRORS; MULTILAYERS; SPECTROSCOPIC ANALYSIS; SYNCHROTRONS; X RAY DIFFRACTION ANALYSIS;

GÖBEL MIRRORS; MULTILAYER OPTICS; SYNCHROTRON SOURCES; X-RAY FLUORESCENCE SPECTROMETRY;

X RAY OPTICS;

EID: 33745793196     PISSN: 09340866     EISSN: 15214117     Source Type: Journal    
DOI: 10.1002/ppsc.200501000     Document Type: Conference Paper

References (3)

1. D. L. Windt, Simulation: IMD-Software for modeling the optical properties of multilayer films, Computer in Physics 1998, 12 (4).
2. C. Michaelsen, J. Wiesmann, C. Hoffmann, A. Oehr, A. B. Storm, L. J. Seijbel, "Optimized performance of graded multilayer optics for X-ray single crystal diffraction", Proc. SPIE 5193, 2004, pp. 211-219.
3. M. Montel, X-ray Microscopy and Microradiography, Academic Press, New York, 1957, pp. 177-185.