Depth profiling by confocal Raman microspectroscopy: Semi-empirical modeling of the Raman response

Applied Spectroscopy

Volumn 61, Issue 2, 2007, Pages 177-185

  Tomba, J Pablo ^a   Arzondo, Luis M ^a   Pastor, José M ^b  

^a UNIVERSIDAD NACIONAL DE MAR DEL PLATA   (Argentina)

^b UNIVERSITY OF VALLADOLID   (Spain)

Author keywords

Confocal raman microspectroscopy; Depth resolution; Dry objectives; Polymer films; Refraction

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; LASER BEAMS; POLYETHYLENES; POLYMETHYL METHACRYLATES; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SILICON WAFERS;

CONFOCAL APERTURES; CONFOCAL RAMAN MICROSPECTROSCOPY; DEPTH PROFILING; DEPTH RESOLUTION; LASER REFRACTION; POLYMER FILMS;

INTERFACES (MATERIALS);

EID: 33847410054     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/000370207779947477     Document Type: Article

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