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Volumn 66, Issue 3, 2010, Pages 407-420

Electron beam-specimen interactions and their effect on high-angle annular dark-field imaging of dopant atoms within a crystal

Author keywords

Bloch waves; Dopant atoms; High angle annular dark field (HAADF) imaging; Optical sectioning; Perturbation theory; Scanning transmission electron microscopy (STEM)

Indexed keywords


EID: 77951267517     PISSN: 01087673     EISSN: 16005724     Source Type: Journal    
DOI: 10.1107/S0108767310004770     Document Type: Article
Times cited : (4)

References (22)
  • 13


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.