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Surface Science

Volumn 604, Issue 11-12, 2010, Pages 996-1001

STM and HREELS investigation of gas phase silanization on hydroxylated Si(100)

(2) Fan, C a Lopinski, G P a

a NATIONAL RESEARCH COUNCIL CANADA (Canada)

Author keywords

Functionalization; Gas phase; HREELS; Silane; Silicon; STM

Indexed keywords

ATOMICALLY FLAT SURFACE; FUNCTIONALIZATIONS; GASPHASE; HIGH EXPOSURES; HIGH-RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY; HREELS; HYDROGEN BONDING INTERACTIONS; HYDROXYL GROUPS; HYDROXYLATED SURFACES; OXYGEN ATOM; ROOM TEMPERATURE; SCANNING TUNNELING MICROSCOPY (STM); SEMI-EMPIRICAL; SI(1 0 0); SI(100) SURFACE; SI-O-SI BOND; SILANIZATIONS; STM IMAGES; SURFACE HYDROXYL GROUPS; WATER DISSOCIATION;

DISSOCIATION; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISSIPATION; GASES; HIGH RESOLUTION ELECTRON MICROSCOPY; HYDROGEN BONDS; HYDROXYLATION; OXYGEN; SILICON;

SCANNING TUNNELING MICROSCOPY;

EID: 77951257781 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2010.03.003 Document Type: Article

Times cited : (14)

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