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Volumn 168, Issue 1, 2010, Pages 36-39

Field electron emission from GaN/W tips

Author keywords

Field emission current fluctuations; Field emission microscopy; GaN; Plasma assisted reactive evaporation

Indexed keywords

ANNEALING; EVAPORATION; FIELD EMISSION; III-V SEMICONDUCTORS; NITROGEN PLASMA; SCANNING ELECTRON MICROSCOPY;

EID: 77951254636     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2009.12.037     Document Type: Article
Times cited : (2)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.