Fault-tolerant synthesis using non-uniform redundancy

Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors

Volumn , Issue , 2009, Pages 213-218

  Woo, Keven L ^a   Guthaus, Matthew R ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AREA OVERHEAD; CROSS-COUPLINGS; DYNAMIC PROGRAMMING ALGORITHM; FAULT-TOLERANT; FLICKER NOISE; LINEAR-RUN; NANO-METER REGIMES; NATURAL RADIATION; NONUNIFORM; ON CHIPS; PARETO-OPTIMAL SETS; PROCESS TECHNOLOGIES; SUBOPTIMAL SOLUTION; TRANSIENT FAULTS; TRIPLE MODULAR REDUNDANCY;

DESIGN; FAULT TOLERANT COMPUTER SYSTEMS; REDUNDANCY;

QUALITY ASSURANCE;

EID: 77950985240     PISSN: 10636404     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCD.2009.5413153     Document Type: Conference Paper

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