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Volumn 207, Issue 3, 2010, Pages 548-551
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Medium-range order in a-Si:H films prepared from hydrogen diluted silane
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Author keywords
[No Author keywords available]
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Indexed keywords
A-SI:H;
DIFFRACTION PEAKS;
FLOW RATIOS;
FULL WIDTH OF HALF MAXIMUM;
HYDROGEN DILUTED SILANE;
HYDROGENATED SILICON;
MEDIUM RANGE ORDER;
ORDERED DOMAINS;
PLASMA ENHANCED CHEMICAL VAPOUR DEPOSITION;
SINGLE CRYSTALLINE SILICON;
TETRAGONAL LATTICES;
XRD;
XRD ANALYSIS;
AMORPHOUS FILMS;
FILM PREPARATION;
METALLIC FILMS;
PLASMA DEPOSITION;
RAMAN SPECTROSCOPY;
SILANES;
STRUCTURAL ANALYSIS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
AMORPHOUS SILICON;
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EID: 77950980024
PISSN: 18626300
EISSN: 18626319
Source Type: Journal
DOI: 10.1002/pssa.200982759 Document Type: Article |
Times cited : (6)
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References (13)
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