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Volumn 10, Issue 9, 2010, Pages 772-776

Effect of plasma cleaning process in the wettability of flip chip PBGA substrate of integrated circuit packages

Author keywords

Flip chip; PBGA; Plasma cleaning; Semiconductor packaging; Wettability

Indexed keywords

FLIP CHIP; INTEGRATED CIRCUIT PACKAGE; INTEGRATED CIRCUIT PACKAGING; PACKAGING SUBSTRATES; PBGA; PLASMA CLEANING; SEMICONDUCTOR PACKAGING; SUBSTRATE SURFACE;

EID: 77950908314     PISSN: 18125654     EISSN: 18125662     Source Type: Journal    
DOI: 10.3923/jas.2010.772.776     Document Type: Article
Times cited : (8)

References (11)
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    • Alberici, S.1    Dellafiore, A.2    Manzo, G.3    Santospirito, G.4    Villa, C.M.5    Zanotti, L.6
  • 3
    • 0028460566 scopus 로고
    • Plasma modification of polymer surfaces for adhesion improvement
    • Egitto, F.D. and L.J. Matienzo, 1994. Plasma modification of polymer surfaces for adhesion improvement. IBM J. Res. Dev., 38: 423-439.
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    • Egitto, F.D.1    Matienzo, L.J.2
  • 4
    • 33645653966 scopus 로고    scopus 로고
    • How plasma-enhanced surface modification improves the production of microelectronics and optoelectronics?
    • Getty, J.D., 2002. How plasma-enhanced surface modification improves the production of microelectronics and optoelectronics? Chip Scale Rev.
    • (2002) Chip Scale Rev
    • Getty, J.D.1
  • 5
    • 0033077681 scopus 로고    scopus 로고
    • Effects of hollow cathode and Ar/H2ratio on plasma cleaning of Cu leadframe
    • Hsieh, J.H., L.H. Fong, S. Yi and G. Metha, 1999. Effects of hollow cathode and Ar/H2ratio on plasma cleaning of Cu leadframe. Surf. Coat Tech., 112: 235-249.
    • (1999) Surf. Coat Tech , vol.112 , pp. 235-249
    • Hsieh, J.H.1    Fong, L.H.2    Yi, S.3    Metha, G.4
  • 8
    • 33750997915 scopus 로고    scopus 로고
    • Effect of plasma treatment on adhesion characteristics at interfaces between underfill and substrate
    • Noh, B.I., C.S. Seok, W.C. Moon and S.B. Jung, 2007. Effect of plasma treatment on adhesion characteristics at interfaces between underfill and substrate. Int. J. Adhesion Adhesives, 27: 200-206.
    • (2007) Int. J. Adhesion Adhesives , vol.27 , pp. 200-206
    • Noh, B.I.1    Seok, C.S.2    Moon, W.C.3    Jung, S.B.4
  • 9
    • 1642620140 scopus 로고    scopus 로고
    • Solderability testing in nitrogen atmosphere of plasma treated HASL finish PCBs for fluxless soldering
    • Proceedings of 23rd, Oct. 19-21, Austin, TX
    • Takyi, G., N.N. Ekere and J.D. Philpott, 1998. Solderability testing in nitrogen atmosphere of plasma treated HASL finish PCBs for fluxless soldering. Proceedings of 23rd IEEE/CPMT Electronics Manufacturing Technology Symposium, Oct. 19-21, Austin, TX, pp: 172-186.
    • (1998) IEEE/CPMT Electronics Manufacturing Technology Symposium , pp. 172-186
    • Takyi, G.1    Ekere, N.N.2    Philpott, J.D.3
  • 10
    • 84888276821 scopus 로고    scopus 로고
    • Plasma consideration for advanced packaging
    • Zhao, J. and J.D. Getty, 2005. Plasma consideration for advanced packaging. Chip Scale Rev
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    • Zhao, J.1    Getty, J.D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.