Silicon nanocrystals on bottle resonators: Mode structure, loss mechanisms and emission dynamics

Optics Express

Volumn 18, Issue 8, 2010, Pages 8466-8481

  Bianucci, P ^a   Wang, X ^a,b   Veinot, J G C ^a   Meldrum, A ^a,b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BOTTLES; NANOCRYSTALS; Q FACTOR MEASUREMENT; SURFACE ROUGHNESS;

EMISSION DYNAMICS; EXCITED CARRIERS; HIGH Q FACTOR; LIMITING FACTORS; LOSS MECHANISMS; LUMINESCENT SILICON NANOCRYSTALS; MICRO RESONATORS; MODE SPECTRUM; MODE STRUCTURE; PHOTOLUMINESCENCE SPECTRUM; Q-FACTORS; SILICON NANOCRYSTALS; SMOOTH LAYER; SURFACE ROUGHNESS SCATTERING; WHISPERING GALLERY MODES;

RESONATORS;

BOTTLES; ROUGHNESS; SURFACE PROPERTIES;

EID: 77950870702     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.008466     Document Type: Article

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