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Japanese Journal of Applied Physics

Volumn 49, Issue 1 Part 2, 2010, Pages

Evaluation of reliability in rubrene-based organic light emitting devices with a mixed single layer

(3) Wang, Zhaokui a Okada, Hiroyuki a Naka, Shigeki a

a UNIVERSITY OF TOYAMA (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DARK SPOTS; EMISSION PROPERTIES; GROWTH AREAS; HALF LIFETIME; HETEROJUNCTION INTERFACES; HETEROSTRUCTURE DEVICES; HOLE TRANSPORT MATERIALS; OPERATIONAL LIFETIME; OPERATIONAL VOLTAGE; ORGANIC LIGHT-EMITTING DEVICES; ORGANIC MOLECULES; RUBRENES; SINGLE LAYER; SINGLE LAYER DEVICES; VOLTAGE CHARACTERISTICS;

ELECTRIC FIELDS; ELECTRIC PROPERTIES; HETEROJUNCTIONS; LIGHT EMISSION; RELIABILITY;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 77950856332 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.49.01AA02 Document Type: Article

Times cited : (15)

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