Direct evidence of molecular aggregation and degradation mechanism of organic light-emitting diodes under joule heating: An STM and photoluminescence study

Journal of Physical Chemistry B

Volumn 109, Issue 5, 2005, Pages 1675-1682

  Gong, Jian Ru ^a,d   Wan, Li Jun ^a   Lei, Sheng Bin ^a   Bai, Chun Li ^a   Zhang, Xiao Hong ^b   Lee, Shuit Tong ^c  

^a INSTITUTE OF CHEMISTRY   (China)

^b TECHNICAL INSTITUTE OF PHYSICS AND CHEMISTRY   (China)

^c CITY UNIVERSITY OF HONG KONG   (Hong Kong)

^d UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ORGANIC LIGHT-EMITTING DIODES (OLED); ORGANIC MATERIALS; PHOTOEMISSION SPECTROSCOPY; THERMAL HEATING;

ANNEALING; DEGRADATION; ELECTRODES; ELECTRONIC STRUCTURE; ENERGY TRANSFER; FERMI LEVEL; INTERFACES (MATERIALS); MIXTURES; MOLECULAR STRUCTURE; MULTILAYERS; PHASE SEPARATION; PHENOLS; PHOTOEMISSION; PHOTOLUMINESCENCE; SCANNING TUNNELING MICROSCOPY;

LIGHT EMITTING DIODES;

EID: 13444259921     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp046509o     Document Type: Article

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