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Applied Physics Express

Volumn 3, Issue 4, 2010, Pages

Contact conductance measurement of locally suspended graphene on SiC

(4) Nagase, Masao a Hibino, Hiroki a Kageshima, Hiroyuki a Yamaguchi, Hiroshi a

a NTT Basic Research Laboratories (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT CONDUCTANCE; CONTACT FORCES; ELECTRICAL CONDUCTANCE; MICRO-PROBES; NANO CONTACTS; NON-LINEAR CURRENT-VOLTAGE CHARACTERISTICS; TUNNELING JUNCTIONS;

ATOMIC FORCE MICROSCOPY; GRAPHENE; GRAPHITE; RHODIUM; SILICON CARBIDE;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 77950658528 PISSN: 18820778 EISSN: 18820786 Source Type: Journal
DOI: 10.1143/APEX.3.045101 Document Type: Article

Times cited : (19)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.