Artificial neural networks in applying MCUSUM residuals charts for AR(1) processes

Applied Mathematics and Computation

Volumn 189, Issue 2, 2007, Pages 1889-1901

  Arkat, Jamal ^a   Niaki, Seyed Taghi Akhavan ^b   Abbasi, Babak ^b  

^a IRAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Iran)

^b SHARIF UNIVERSITY OF TECHNOLOGY   (Iran)

Author keywords

Artificial neural networks; Autocorrelation; Average run length; MCUSUM control charts; Multi layer perceptrons; Residual chart

Indexed keywords

AUTOCORRELATION; MATHEMATICAL MODELS; QUALITY CONTROL; VECTORS;

AVERAGE RUN LENGTH; CHEMICAL PROCESSES; CONTROL CHARTS; RESIDUAL CHART;

MULTILAYER NEURAL NETWORKS;

EID: 34249067480     PISSN: 00963003     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.amc.2006.12.081     Document Type: Article

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