Interval charting schemes for joint monitoring of process mean and variance

Quality and Reliability Engineering International

Volumn 20, Issue 4, 2004, Pages 291-303

  Gan, F F ^a   Ting, K W ^a   Chang, T C ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b UNIVERSITY OF MACAU   (Macao)

Author keywords

Average run length; Geometrical representation; Joint monitoring; Shewhart chart; Statistical process control

Indexed keywords

DATA REDUCTION; JOINTS (STRUCTURAL COMPONENTS); MONITORING; PRINTED CIRCUIT BOARDS; SEMICONDUCTOR MATERIALS; SOLDERING; STATISTICAL METHODS;

AVERAGE RUN LENGTH; GEOMETRICAL REPRESENTATION; JOINT MONITORING; SHEWART CHART;

PROCESS CONTROL;

EID: 2942737024     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.543     Document Type: Article

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