Evolution of barrier-resistance noise in CoFeB/MgO/CoFeB tunnel junctions during annealing

Journal of Applied Physics

Volumn 107, Issue 6, 2010, Pages

  Stearrett, Ryan ^a   Wang, W G ^a   Shah, L R ^a   Gokce, Aisha ^a   Xiao, J Q ^a   Nowak, E R ^a  

^a UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; ANNEALING TIME; BIAS DEPENDENCE; HIGH TEMPERATURE; LOW FREQUENCY; MAGNETIC TUNNEL JUNCTION; MGO BARRIER; NOISE LEVELS; TUNNELING MAGNETORESISTANCE; VACANCY DEFECTS; VOLTAGE BIAS;

ELECTRIC RESISTANCE; MAGNETIC FIELD EFFECTS; MAGNETORESISTANCE; TUNNEL JUNCTIONS; VACANCIES; WIND TUNNELS;

ANNEALING;

EID: 77950552920     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3327440     Document Type: Conference Paper

References (22)

1. W. H. Butler, X. G. Zhang, T. C. Schulthess, and J. M. MacLaren, Phys. Rev. B 0163-1829 63, 054416 (2001). 10.1103/PhysRevB.63.054416
2. J. Mathon and A. Umerski, Phys. Rev. B 0163-1829 63, 220403 (2001). 10.1103/PhysRevB.63.220403
3. S. Yuasa, T. Nagahama, A. Fukushima, Y. Suzuki, and K. Ando, Nature Mater. 1476-1122 3, 868 (2004). 10.1038/nmat1257
4. S. S. P. Parkin, C. Kaiser, A. Panchula, P. M. Rice, B. Hughes, M. Samant, and S. -H. Yang, Nat. Mater. 3, 862 (2004). 10.1038/nmat1256 1476-1122
5. W. F. Egelhoff, Jr., P. W. T. Pong, J. Unguris, R. D. McMichael, E. R. Nowak, A. S. Edelstein, J. E. Burnette, and G. Fischer, Sens. Actuators, A 0924-4247 155, 217 (2009). 10.1016/j.sna.2009.08.016
6. W. G. Wang, C. Ni, A. Rumaiz, Y. Wang, X. Fan, T. Moriyama, R. Cao, Q. Y. Wen, H. W. Zhang, and J. Q. Xiao, Appl. Phys. Lett. 0003-6951 92, 152501 (2008). 10.1063/1.2903147 (Pubitemid 351555717)
7. S. Yuasa and D. D. Djayaprawira, J. Phys. D 0022-3727 40, R337 (2007). 10.1088/0022-3727/40/21/R01 (Pubitemid 350006763)
8. J. Scola, H. Polovy, C. Fermon, M. Pannetier-Lecoeur, G. Feng, K. Fahy, and J. M. D. Coey, Appl. Phys. Lett. 0003-6951 90, 252501 (2007). 10.1063/1.2749433 (Pubitemid 47141212)
9. S. H. Liou, R. Zhang, S. E. Russek, L. Yuan, S. T. Halloran, and D. P. Pappas, J. Appl. Phys. 0021-8979 103, 07E920 (2008). 10.1063/1.2837659 (Pubitemid 351538599)
10. A. Ozbay, A. Gokce, T. Flanagan, R. Stearrett, E. R. Nowak, and C. Nordman, Appl. Phys. Lett. 0003-6951 94, 202506 (2009). 10.1063/1.3139067
11. A. Gokce, E. R. Nowak, S. H. Yang, and S. S. P. Parkin, J. Appl. Phys. 0021-8979 99, 08A906 (2006). 10.1063/1.2169591 (Pubitemid 43746349)
12. J. M. Almeida, P. Wisniowski, and P. P. Freitas, IEEE Trans. Magn. 0018-9464 44, 2569 (2008). 10.1109/TMAG.2008.2002604
13. L. Jiang, E. R. Nowak, P. E. Scott, J. Johnson, J. M. Slaughter, J. J. Sun, and R. W. Dave, Phys. Rev. B 0163-1829 69, 054407 (2004). 10.1103/PhysRevB.69.054407
14. E. R. Nowak, M. B. Weissman, and S. S. P. Parkin, Appl. Phys. Lett. 0003-6951 74, 600 (1999). 10.1063/1.123158
15. E. R. Nowak, R. D. Merithew, M. B. Weissman, I. Bloom, and S. S. P. Parkin, J. Appl. Phys. 0021-8979 84, 6195 (1998). 10.1063/1.368936
16. W. G. Wang, J. Jordan-Sweet, G. X. Miao, C. Ni, A. K. Rumaiz, L. R. Shah, X. Fan, P. Parsons, R. Stearrett, E. R. Nowak, J. S. Moodera, and J. Q. Xiao, Appl. Phys. Lett. 0003-6951 95, 242501 (2009). 10.1063/1.3273397
17. F. N. Hooge, Physica (Utrecht) 0031-8914 60, 130 (1972). 10.1016/0031-8914(72)90226-1
18. D. M. Fleetwood and N. Giordano, Phys. Rev. B 0163-1829 27, 667 (1983). 10.1103/PhysRevB.27.667
19. M. J. Kirton and M. J. Uren, Adv. Phys. 0001-8732 38, 367 (1989). 10.1080/00018738900101122
20. P. G. Mather, J. C. Read, and R. A. Buhrman, Phys. Rev. B 0163-1829 73, 205412 (2006). 10.1103/PhysRevB.73.205412 (Pubitemid 43752533)
21. F. G. Aliev, R. Guerrero, D. Herranz, R. Villar, F. Greullet, C. Tiusan, and M. Hehn, Appl. Phys. Lett. 0003-6951 91, 232504 (2007). 10.1063/1.2822812 (Pubitemid 350234466)
22. R. Guerrero, D. Herranz, F. G. Aliev, F. Greullet, C. Tiusan, M. Hehn, and F. Montaigne, Appl. Phys. Lett. 0003-6951 91, 132504 (2007). 10.1063/1.2793619 (Pubitemid 47502582)