Structural, electrical, and optical characterizations of laser deposited nanometric iron oxide films

Journal of Vacuum Science and Technology B

Volumn 28, Issue 2, 2010, Pages 295-300

  Caricato, A P ^a   Gorbachuk, N T ^b   Korduban, A M ^c   Leggieri, G ^a   Luches, A ^a   Mengucci, P ^d   Mulenko, S A ^c   Valerini, D ^a  

^a UNIVERSITY OF SALENTO   (Italy)

^b KYIV NATIONAL UNIVERSITY OF TECHNOLOGIES AND DESIGN   (Ukraine)

^c INSTITUTE OF METAL PHYSICS   (Ukraine)

^d UNIVERSITÀ POLITECNICA DELLE MARCHE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY GAP; EXCIMER LASERS; FLUORINE COMPOUNDS; HEMATITE; OXIDE FILMS; SEMICONDUCTOR LASERS; SILICA; SURFACE ROUGHNESS; X RAY DIFFRACTION;

ELECTRICAL CHARACTERISTIC; ELECTRICAL CHARACTERIZATION; IRON OXIDE FILMS; KRF EXCIMER LASER; LOW PRESSURES; NANOMETRICS; OPTICAL CHARACTERISTICS; OPTICAL CHARACTERIZATION; STRUCTURAL CHARACTERISTICS; STRUCTURAL CHARACTERIZATION;

SCANNING ELECTRON MICROSCOPY;

EID: 77950548996     PISSN: 21662746     EISSN: 21662754     Source Type: Journal    
DOI: 10.1116/1.3308973     Document Type: Article

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