Effect of oxidation on thickness dependencies of thermoelectric properties in PbTe/mica thin films

Thin Solid Films

Volumn 476, Issue 2, 2005, Pages 391-395

  Rogacheva, E I ^a   Lyubchenko, S G ^a   Dresselhaus, M S ^b  

^a NATIONAL TECHNICAL UNIVERSITY   (Ukraine)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Electrical properties and measurements; Epitaxy; Lead telluride; Oxidation

Indexed keywords

CHARGE CARRIERS; EPITAXIAL GROWTH; LEAD COMPOUNDS; MICA; OXIDATION; TELLURIUM; THERMOELECTRICITY; THICKNESS MEASUREMENT;

ELECTRICAL PROPERTIES AND MEASUREMENTS; FILM THICKNESS; LEAD TELLURIDE; OXYGEN PRESSURE;

THIN FILMS;

EID: 13844255592     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.10.048     Document Type: Article

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