TiO2 films prepared by ultrasonic spray pyrolysis

Materials Science and Technology

Volumn 26, Issue 4, 2010, Pages 469-472

  Nakaruk, A ^a   Reece, P J ^a   Ragazzon, D ^a   Sorrell, C C ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

Optical properties; Photoluminescence; Titanium dioxide; Ultrasonic spray pyrolysis

Indexed keywords

CONCENTRATION OF; MEAN FREE PATH; PHASE TRANSFORMATION TEMPERATURE; QUARTZ WAFERS; SILICON CONTAMINATION; STRUCTURAL DEFECT; TIO; ULTRASONIC SPRAY PYROLYSIS; ULTRAVIOLET-VISIBLE SPECTROPHOTOMETRY;

CRYSTALLOGRAPHY; MINERALOGY; MINERALS; OXIDE MINERALS; OXYGEN; OXYGEN VACANCIES; PHOTOLUMINESCENCE; QUARTZ; REFRACTIVE INDEX; SILICON WAFERS; THERMOGRAVIMETRIC ANALYSIS; TITANIUM; TITANIUM DIOXIDE; ULTRASONICS; X RAY DIFFRACTION;

SPRAY PYROLYSIS;

EID: 77950527290     PISSN: 02670836     EISSN: 17432847     Source Type: Journal    
DOI: 10.1179/026708309X12468927349299     Document Type: Article

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