Clustering effects in Ga(AsBi)

Applied Physics Letters

Volumn 96, Issue 13, 2010, Pages

  Imhof, Sebastian ^a   Thränhardt, Angela ^a   Chernikov, Alexej ^b   Koch, Martin ^b   Köster, Niko S ^b   Kolata, Kolja ^b   Chatterjee, Sangam ^b   Koch, Stephan W ^b   Lu, Xianfeng ^c   Johnson, Shane R ^c   Beaton, Dan A ^d   Tiedje, Thomas ^e   Rubel, Oleg ^f,g  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^b PHILIPPS UNIVERSITY MARBURG   (Germany)

^c Arizona State University   (United States)

^d UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^e UNIVERSITY OF VICTORIA   (Canada)

^f Thunder Bay Regional Research Institute   (Canada)

^g LAKEHEAD UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOY DISORDER; CHARACTERISTIC ENERGY; CLUSTERING EFFECT; LATTICE TEMPERATURES; MONTE CARLO SIMULATION TECHNIQUE; PUMP POWER;

MONTE CARLO METHODS;

COMPUTER SIMULATION;

EID: 77950513447     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3374884     Document Type: Article

References (21)

1. S. Tixier, M. Adamcyk, T. Tiedje, S. Francoeur, A. Mascarenhas, P. Wei, and F. Schiettekatte, Appl. Phys. Lett. APPLAB 0003-6951 82, 2245 (2003). 10.1063/1.1565499
2. S. Francoeur, M. -J. Seong, A. Mascarenhas, S. Tixier, M. Adamcyk, and T. Tiedje, Appl. Phys. Lett. APPLAB 0003-6951 82, 3874 (2003). 10.1063/1.1581983
3. S. Imhof, C. Bückers, A. Thränhardt, J. Hader, J. V. Moloney, and S. W. Koch, Semicond. Sci. Technol. SSTEET 0268-1242 23, 125009 (2008). 10.1088/0268-1242/23/12/125009
4. W. Huang, K. Oe, G. Feng, and M. Yoshimoto, J. Appl. Phys. JAPIAU 0021-8979 98, 053505 (2005). 10.1063/1.2032618 (Pubitemid 41345074)
5. J. Wu, W. Shan, and W. Walukiewicz, Semicond. Sci. Technol. SSTEET 0268-1242 17, 860 (2002). 10.1088/0268-1242/17/8/315
6. A. Mascarenhas, R. Kini, Y. Zhang, R. France, and A. Ptak, Phys. Status Solidi B PSSBBD 0370-1972 246, 504 (2009). 10.1002/pssb.200880547
7. B. Fluegel, S. Francoeur, A. Mascarenhas, S. Tixier, E. C. Young, and T. Tiedje, Phys. Rev. Lett. PRLTAO 0031-9007 97, 067205 (2006). 10.1103/PhysRevLett.97.067205 (Pubitemid 44223142)
8. K. Alberi, J. Wu, W. Walukiewicz, K. M. Yu, O. D. Dubon, S. P. Watkins, C. X. Wang, X. Liu, Y. -J. Cho, and J. Furdyna, Phys. Rev. B PRBMDO 0163-1829 75, 045203 (2007). 10.1103/PhysRevB.75.045203
9. A. Janotti, S. -H. Wei, and S. B. Zhang, Phys. Rev. B PRBMDO 0163-1829 65, 115203 (2002). 10.1103/PhysRevB.65.115203
10. X. Lu, D. A. Beaton, R. B. Lewis, T. Tiedje, and Y. Zhang, Appl. Phys. Lett. APPLAB 0003-6951 95, 041903 (2009). 10.1063/1.3191675
11. G. B. Stringfellow, Organometallic Vapor-Phase Epitaxy, Second Edition: Theory and Practice, 2nd ed. (Academic, New York, 1998).
12. C. F. Klingshirn, Semiconductor Optics (Springer, Berlin, 2006).
13. S. D. Baranovskii, R. Eichmann, and P. Thomas, Phys. Rev. B PRBMDO 0163-1829 58, 13081 (1998). 10.1103/PhysRevB.58.13081
14. O. Rubel, M. Galluppi, S. D. Baranovskii, K. Volz, L. Geelhaar, H. Riechert, P. Thomas, and W. Stolz, J. Appl. Phys. JAPIAU 0021-8979 98, 063518 (2005). 10.1063/1.2058192 (Pubitemid 41415306)
15. O. Rubel, S. D. Baranovskii, K. Hantke, B. Kunert, W. W. Rühle, P. Thomas, K. Volz, and W. Stolz, J. Lumin. JLUMA8 0022-2313 127, 285 (2007). 10.1016/j.jlumin.2007.03.009 (Pubitemid 47238878)
16. A. Miller and E. Abrahams, Phys. Rev. PRVAAH 0096-8250 120, 745 (1960). 10.1103/PhysRev.120.745
17. S. D. Baranovskii and V. G. Karpov, Sov. Phys. Semicond. SPSEAX 0038-5700 18, 828 (1984).
18. Y. P. Varshni, Physica (Amsterdam) PHYSAG 0031-8914 34, 149 (1967). 10.1016/0031-8914(67)90062-6
19. H. Grüning, K. Koharyand, S. D. Baranovskii, O. Rubel, P. J. Klar, A. Ramakrishnan, G. Ebbinghaus, P. Thomas, W. Heimbrodt, W. Stolz, and W. W. Rühle, Phys. Status Solidi C ZZZZZZ 1610-1634 1, 109 (2004). 10.1002/pssc.200303604
20. S. Francoeur, S. Tixier, E. Young, T. Tiedje, and A. Mascarenhas, Phys. Rev. B PRBMDO 0163-1829 77, 085209 (2008). 10.1103/PhysRevB.77.085209
21. O. Rubel, S. D. Baranovskii, K. Hantke, B. Kunert, W. W. Rühle, P. Thomas, K. Volz, and W. Stolz, Phys. Rev. B PRBMDO 0163-1829 73, 233201 (2006). 10.1103/PhysRevB.73.233201 (Pubitemid 43848269)