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Volumn , Issue , 2009, Pages 534-537

Ground bouncing noise aware sequential MTCMOS circuits with data retention capability

Author keywords

[No Author keywords available]

Indexed keywords

90NM CMOS; DATA RETENTION; DESIGN METRICS; LEAKAGE POWER CONSUMPTION; MTCMOS CIRCUITS;

EID: 77950445413     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (10)
  • 5
    • 77950410818 scopus 로고    scopus 로고
    • http://www.umc.com/english/process/g.asp. UMC 90 Nanometer CMOS Technology.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.