Coherent diffraction surface imaging in reflection geometry

Optics Express

Volumn 18, Issue 7, 2010, Pages 7253-7262

  Marathe, Shashidhara ^a   Kim, S S ^b   Kim, S N ^a   Kim, Chan ^a   Kang, H C ^c   Nickles, P V ^a   Noh, D Y ^a  

^a Gwangju Institute of Science and Technology (GIST)   (South Korea)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c Chosun University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; LIGHT SOURCES; NEON; REFLECTION;

APPLICATION AREA; COHERENT DIFFRACTION; COHERENT DIFFRACTION IMAGING; DEPTH PROFILE; HE-NE LASERS; PENETRATION DEPTH; PERIODIC SURFACES; PHASE CHANGE; PHASE IMAGE; PRIOR KNOWLEDGE; QUANTITATIVE INFORMATION; REFLECTION GEOMETRY; REFLECTION PROCESS; SURFACE IMAGE; SURFACE IMAGING;

LIGHT;

GOLD; SILICON;

ALGORITHM; ARTICLE; CHEMISTRY; COMPUTER SIMULATION; EQUIPMENT DESIGN; IMAGE PROCESSING; LASER; OPTICS; SURFACE PROPERTY; THREE DIMENSIONAL IMAGING; ULTRAVIOLET RADIATION; X RAY;

ALGORITHMS; COMPUTER SIMULATION; EQUIPMENT DESIGN; GOLD; IMAGE PROCESSING, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; LASERS; OPTICS AND PHOTONICS; SILICON; SURFACE PROPERTIES; ULTRAVIOLET RAYS; X-RAYS;

EID: 77950222510     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.007253     Document Type: Article

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