A study on structural formation and optical property of wide band-gap Be0.2Zn0.8O layers grown by RF magnetron co-sputtering system

Journal of Crystal Growth

Volumn 312, Issue 10, 2010, Pages 1683-1686

  Yu, J H ^a   Kim, J H ^a   Park, D S ^a   Kim, T S ^a   Jeong, T S ^a   Youn, C J ^a   Hong, K J ^b  

^a Chonbuk National University   (South Korea)

^b Chosun University   (South Korea)

Author keywords

A1. Characterization; A3. RF sputtering; B1. Oxides; B2. Semiconducting II VI materials

Indexed keywords

A3. RF SPUTTERING; B2. SEMICONDUCTING II-VI MATERIALS; BARRIER LAYERS; FREE EXCITONS; HEXAGONAL STRUCTURES; LATTICE SITES; NEUTRAL DONOR; QUANTUM WELL STRUCTURES; RADIO-FREQUENCY MAGNETRON CO-SPUTTERING; RF-MAGNETRON CO-SPUTTERING; RF-SPUTTERING; SEMICONDUCTING II-VI MATERIALS; STRUCTURAL FORMATION; TRANSMITTANCE MEASUREMENTS; ULTRA-VIOLET; UV LIGHT; VISIBLE REGION; WIDE BAND GAP; WIDE BAND-GAP MATERIAL; ZNO;

BINDING ENERGY; CRYSTAL STRUCTURE; EPITAXIAL GROWTH; EXCITONS; LIGHT EMISSION; LIGHT EMITTING DIODES; MAGNETRONS; OPTICAL PROPERTIES; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR QUANTUM WELLS; STOICHIOMETRY; SULFUR COMPOUNDS; ZINC; ZINC OXIDE;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 77950188347     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2010.02.014     Document Type: Article

References (17)

1. Mita A., Thareja R.K., Ganesan V., Gupta A., Sahoo P.K., and Kulkarni V.N. Appl. Surf. Sci. 174 (2001) 323
2. Miami T., Yamamoto T., and Miyata T. Thin Solid Films 366 (2000) 63
3. Huang M.H., Mao S., Feick H., Yan H., Wu Y., Kind H., Weber E., Russo R., and Yang P. Science 292 (2001) 1897
4. Hsueh T.J., Hsu C.L., Chang S.J., Guo P.W., Hsieh J.H., and Chen I.C. Scr. Mater. 57 (2007) 53
5. Ryu Y.R., Lubguban J.A., Lee T.S., White H.W., Jeong T.S., Youn C.J., and Kim B.J. Appl. Phys. Lett. 90 (2007) 131115
6. Craford M.G., Holonyak N., and Kish F.A. Sci. Am. 284 (2001) 63
7. Jeong T.S., Han M.S., Kim J.H., Bae S.J., and Youn C.J. J. Phys. D 40 (2007) 370
8. D.S. Park, J.H. Kim, J.H. Yu, T.S. Jeong, C.J. Youn, K.J. Hong, J. Korean Phys. Soc. 56 (2010) 70
9. Lennon C., Tapia R.B., Kodama R., Chang Y., Sivananthan S., and Deshpande M. J. Electron. Mater. 38 (2009) 1568
10. Moulder J.F., Stickle W.F., Sobol P.E., and Bomben K.D. In: Chastain J. (Ed). Handbook of X-ray Photoelectron Spectroscopy. 2nd ed. (1992), Perking-Elmer Corporation, Eden Prairie end of the book
11. Chen M., Wang X., Yu Y.H., Pei Z.L., Bai X.D., Sun C., Huang R.F., and Wang L.S. Appl. Surf. Sci. 158 (2000) 134
12. Wagner C.D., Moulder J.F., Davis L.E., and Riggs W.M. In: Muilenberg E. (Ed). Handbook of X-ray Photoelectron Spectroscopy. 1st ed. (1979), Perking-Elmer Corporation, Physical Electronics Division, Eden Prairie end of the book
13. Sakai K., Noguchi K., Fukuyam A., Ikari T., and Okada T. Jpn. J. Appl. Phys. 48 (2009) 085001
14. Youn C.J., Jeong T.S., Han M.S., and Kim J.H. J. Crystal Growth 261 (2004) 526
15. Wong E.M., and Searson P.C. Appl. Phys. Lett. 74 (1999) 2939
16. Guo L., Yang S., Yang C., Yu P., Wang J., Ge W., and Wong G.K.L. Appl. Phys. Lett. 76 (2000) 2901
17. Vanheusden K., Warren W.L., Seager C.H., Tallant D.R., Voigt J.A., and Gnade B.E. J. Appl. Phys. 79 (1996) 7983