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Volumn 120, Issue 5, 2010, Pages 1041-1051

Mapping quantitative trait loci for quality factors in an inter-class cross of US and Chinese wheat

Author keywords

[No Author keywords available]

Indexed keywords

AFLP MARKERS; COMPOSITE INTERVAL MAPPING; ECONOMIC VALUES; END-USE PRODUCT; GENETIC MAP; GRAIN WEIGHTS; KERNEL WEIGHT; MARKER-ASSISTED SELECTION; MILLING QUALITY; NEAR INFRARED REFLECTANCE; OKLAHOMA; PHENOTYPIC CORRELATIONS; PHENOTYPIC VARIATIONS; QUALITY FACTORS; QUANTITATIVE TRAIT LOCUS; RECOMBINANT INBRED LINES; SINGLE KERNEL; TEST WEIGHT; WHEAT (TRITICUM AESTIVUM L.); WHEAT CULTIVARS; WHEAT GRAINS; WHEAT QUALITY;

EID: 77950019584     PISSN: 00405752     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00122-009-1232-x     Document Type: Article
Times cited : (75)

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