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Volumn 312, Issue 9, 2010, Pages 1610-1616
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Effect of conductive oxide buffering on structural and nanoscale electrical properties of ultrathin SrTiO3 films on Pt electrodes
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Author keywords
A1. Characterization; A3. Physical vapor deposition processes; A3. Polycrystalline deposition; B1. Oxides
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Indexed keywords
A3. POLYCRYSTALLINE DEPOSITION;
B1. OXIDES;
CHEMICAL HOMOGENEITY;
COMPOSITION RATIO;
CONDUCTIVE OXIDES;
CRYSTALLINE STRUCTURE;
DEPOSITION TEMPERATURES;
DIELECTRIC CONSTANTS;
DIELECTRIC THIN FILMS;
ELECTRICAL PROPERTY;
HIGH GROWTH TEMPERATURES;
HIGH TEMPERATURE;
NANO SCALE;
NANOSTRUCTURAL;
OUT-DIFFUSION;
PHYSICAL VAPOR DEPOSITION PROCESS;
POLY CRYSTALLINE DEPOSITION;
PT ELECTRODE;
SI SUBSTRATES;
SRTIO;
STO FILMS;
STO THIN FILMS;
ULTRA-THIN;
ELECTRIC PROPERTIES;
FILM GROWTH;
GROWTH TEMPERATURE;
LEAKAGE CURRENTS;
PHYSICAL VAPOR DEPOSITION;
PLATINUM;
RUTHENIUM ALLOYS;
RUTHENIUM COMPOUNDS;
STRONTIUM ALLOYS;
SURFACE ROUGHNESS;
TITANIUM;
ULTRATHIN FILMS;
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EID: 77949917439
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2010.01.021 Document Type: Article |
Times cited : (3)
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References (20)
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