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Volumn 312, Issue 9, 2010, Pages 1610-1616

Effect of conductive oxide buffering on structural and nanoscale electrical properties of ultrathin SrTiO3 films on Pt electrodes

Author keywords

A1. Characterization; A3. Physical vapor deposition processes; A3. Polycrystalline deposition; B1. Oxides

Indexed keywords

A3. POLYCRYSTALLINE DEPOSITION; B1. OXIDES; CHEMICAL HOMOGENEITY; COMPOSITION RATIO; CONDUCTIVE OXIDES; CRYSTALLINE STRUCTURE; DEPOSITION TEMPERATURES; DIELECTRIC CONSTANTS; DIELECTRIC THIN FILMS; ELECTRICAL PROPERTY; HIGH GROWTH TEMPERATURES; HIGH TEMPERATURE; NANO SCALE; NANOSTRUCTURAL; OUT-DIFFUSION; PHYSICAL VAPOR DEPOSITION PROCESS; POLY CRYSTALLINE DEPOSITION; PT ELECTRODE; SI SUBSTRATES; SRTIO; STO FILMS; STO THIN FILMS; ULTRA-THIN;

EID: 77949917439     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2010.01.021     Document Type: Article
Times cited : (3)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.