Non-destructive depth profiling of the activated Ti-Zr-V getter by means of excitation energy resolved photoelectron spectroscopy

Analytical Sciences

Volumn 26, Issue 2, 2010, Pages 209-215

  Pavluch, Jiř ^a   Zommer, Ludomir ^b   Mašek, Karel ^a   Skála, Tomáš ^c   Šutara, František ^a   Nehasil, Václav ^a   Píš, Igor ^a   Polyak, Yaroslav ^d  

^a CHARLES UNIVERSITY   (Czech Republic)

^b INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^c SINCROTRONE TRIESTE   (Italy)

^d J HEYROVSKÝ INSTITUTE OF PHYSICAL CHEMISTRY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ACTIVATION; DEPTH PROFILING; ELECTRON SPECTROSCOPY; EXCITATION ENERGY; GETTERS; KINETIC ENERGY; PHOTOELECTRONS; PHOTONS; TERNARY ALLOYS; TITANIUM; TITANIUM ALLOYS; TITANIUM METALLOGRAPHY; VANADIUM METALLOGRAPHY; X RAY PHOTOELECTRON SPECTROSCOPY; ZIRCALOY; ZIRCONIUM COMPOUNDS;

ACTIVATION PROCESS; DC MAGNETRON SPUTTERING; MONTE CARLO CALCULATION; PHOTOELECTRON PEAKS; QUANTITATIVE STUDY; SAMPLE CONCENTRATION; SIMPLIFYING ASSUMPTIONS; STAINLESS STEEL SUBSTRATES;

ZIRCONIUM METALLOGRAPHY;

EID: 77949895185     PISSN: 09106340     EISSN: 13482246     Source Type: Journal    
DOI: 10.2116/analsci.26.209     Document Type: Article

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